|Xitronix Corporation is the leading supplier of Photo-Modulated Reflectance metrology equipment to the worldwide semiconductor manufacturing market. PMR technology provides process engineers the unprecedented capability to meaure the electrical and material properties in nanoscale semiconductor structures during the manufacturing process. The direct sensitivity to active electronic properties of nanostructures provided by PMR is a critical need in chip manufacturing. Other optical characterization technologies do not provide direct sensitivity to electronic properties and are not effective for process control.
Xitronix' focus is on providing long-term competitive advantage to its key customers through the adoption of its PMR technology. Founded in 2006 and based in Austin, Texas, Xitronix has numerous US and international patents based on its state-of-the-art PMR technology. Xitronix provides sales and support to advanced process semiconductor manufacturers worldwide.
Founder & Chief Executive Officer
Judd Chism is a founder of Xitronix Corporation and serves as CEO. He has been instrumental in launching the company from start-up, including raising private investment capital. Prior to founding Xitronix, Judd worked in the Investment Banking division of Sheshunoff & Co., where he focused on mergers and acquisitions, strategic advisory and capital raising for financial institutions.
Judd received his BBA from the University of Texas at Austin. He is a CFA charterholder and a certified public accountant. Judd has served on the boards of several non-profit organizations.
Will Chism, Ph.D.
Founder & Chief Technology Officer
Dr. Will Chism is a founder of Xitronix Corporation and serves as CTO. He is an expert in optical metrology and is the inventor of Xitronix' Photo-Modulated Reflectance (PMR) technology. He directs to the development of Xitronix' technology and product commercialization. Previously, Will was the Lead Research Scientist for the Advanced Metrology Development Project at International Sematech, where he managed optical metrology research within a consortium of major semiconductor chip microelectronics.
Will holds a Ph.D. in Physics from the University of Texas at Austin. He holds eight US and international patents and has published numerous scientific papers.